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Journal: Electronics, 2025
Volume: 14
Number: 3805

Article: An Attention-Driven Multi-Scale Framework for Rotating-Machinery Fault Diagnosis Under Noisy Conditions
Authors: by Le-Min Xu, Pak Kin Wong, Zhi-Jiang Gao, Zhi-Xin Yang, Jing Zhao and Xian-Bo Wang
Link: https://www.mdpi.com/2079-9292/14/19/3805

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