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        Journal: Electronics, 2025
        Volume: 14 
                	Number: 3805 
                
        
        Article:
        An Attention-Driven Multi-Scale Framework for Rotating-Machinery Fault Diagnosis Under Noisy Conditions 
        Authors: 
       	by
                    Le-Min Xu, Pak Kin Wong, Zhi-Jiang Gao, Zhi-Xin Yang, Jing Zhao and Xian-Bo Wang        
        Link:
        https://www.mdpi.com/2079-9292/14/19/3805
        
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