Xu, L.-M.; Wong, P.K.; Gao, Z.-J.; Yang, Z.-X.; Zhao, J.; Wang, X.-B.
An Attention-Driven Multi-Scale Framework for Rotating-Machinery Fault Diagnosis Under Noisy Conditions. Electronics 2025, 14, 3805.
https://doi.org/10.3390/electronics14193805
AMA Style
Xu L-M, Wong PK, Gao Z-J, Yang Z-X, Zhao J, Wang X-B.
An Attention-Driven Multi-Scale Framework for Rotating-Machinery Fault Diagnosis Under Noisy Conditions. Electronics. 2025; 14(19):3805.
https://doi.org/10.3390/electronics14193805
Chicago/Turabian Style
Xu, Le-Min, Pak Kin Wong, Zhi-Jiang Gao, Zhi-Xin Yang, Jing Zhao, and Xian-Bo Wang.
2025. "An Attention-Driven Multi-Scale Framework for Rotating-Machinery Fault Diagnosis Under Noisy Conditions" Electronics 14, no. 19: 3805.
https://doi.org/10.3390/electronics14193805
APA Style
Xu, L.-M., Wong, P. K., Gao, Z.-J., Yang, Z.-X., Zhao, J., & Wang, X.-B.
(2025). An Attention-Driven Multi-Scale Framework for Rotating-Machinery Fault Diagnosis Under Noisy Conditions. Electronics, 14(19), 3805.
https://doi.org/10.3390/electronics14193805