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Journal: Electronics, 2025
Volume: 14
Number: 3477

Article: Redundancy-Interpolated Three-Segment DAC with On-Chip Digital Calibration for Improved Static Linearity
Authors: by Godfred Bonsu, Kelvin Tamakloe, Isaac Bruce, Emmanuel Nti Darko and Degang Chen
Link: https://www.mdpi.com/2079-9292/14/17/3477

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