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Journal: Electronics, 2025
Volume: 14
Number: 3343

Article: Residual Skewness Monitoring-Based Estimation Method for Laser-Induced Breakdown Spectroscopy
Authors: by Bin Zhu, Xiangcheng Shen, Tao Liu, Sirui Wang, Yuhua Hang, Jianhua Mo, Lei Shao and Ruizhi Wang
Link: https://www.mdpi.com/2079-9292/14/17/3343

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