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Journal: Electronics, 2025
Volume: 14
Number: 3151
Article:
Electromigration Failures in Integrated Circuits: A Review of Physics-Based Models and Analytical Methods
Authors:
by
Ping Cheng, Ling-Feng Mao, Wen-Hao Shen and Yu-Ling Yan
Link:
https://www.mdpi.com/2079-9292/14/15/3151
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