Liu, W.; Huang, G.; Ding, Y.; Yan, C.; Yu, X.; Zhao, L.; Zhao, Y.
A Reflection-Based Ultra-Fast Measurement Method for the Continuous Characterization of Self-Heating for Advanced MOSFETs. Electronics 2025, 14, 2634.
https://doi.org/10.3390/electronics14132634
AMA Style
Liu W, Huang G, Ding Y, Yan C, Yu X, Zhao L, Zhao Y.
A Reflection-Based Ultra-Fast Measurement Method for the Continuous Characterization of Self-Heating for Advanced MOSFETs. Electronics. 2025; 14(13):2634.
https://doi.org/10.3390/electronics14132634
Chicago/Turabian Style
Liu, Wei, Guoqixin Huang, Yaru Ding, Chu Yan, Xinwei Yu, Liang Zhao, and Yi Zhao.
2025. "A Reflection-Based Ultra-Fast Measurement Method for the Continuous Characterization of Self-Heating for Advanced MOSFETs" Electronics 14, no. 13: 2634.
https://doi.org/10.3390/electronics14132634
APA Style
Liu, W., Huang, G., Ding, Y., Yan, C., Yu, X., Zhao, L., & Zhao, Y.
(2025). A Reflection-Based Ultra-Fast Measurement Method for the Continuous Characterization of Self-Heating for Advanced MOSFETs. Electronics, 14(13), 2634.
https://doi.org/10.3390/electronics14132634
