Feature Decoupling-Guided Annotation Framework for Surface Defects on Steel Strips
Abstract
1. Introduction
- (1)
- Proposing a feature decoupling-guided defect representation model: To address the issue of feature aliasing, this model systematically analyzes the grayscale distribution patterns of defects and integrates feature decoupling theory to categorize defects into three typical forms: block, linear, and textured defects. This systematic defect representation approach provides a new analytical perspective for defect annotation, enhances objectivity, and helps annotators better understand and annotate defect features with clarity.
- (2)
- Developing a feature decoupling-guided annotation strategy: To tackle the issues of uncertain annotation areas and boundary ambiguity, this strategy constructs the minimum annotation units for different defect forms and designs boundary localization strategies based on their respective grayscale distribution patterns. This approach effectively mitigates feature aliasing problems and achieves more precise feature representation.
- (3)
- Establishing a systematic annotation framework: By integrating feature decoupling theory with grayscale distribution analysis, this framework formulates a comprehensive annotation methodology. Experimental results demonstrate that the framework provides systematic practical guidance for annotation, significantly improves the accuracy of feature representation, enhances the detection performance, and offers a practical reference for annotating complex defect scenarios.
2. Methodology
2.1. Defect Representation Model Guided by Feature Decoupling
2.2. Annotation Strategy Based on Minimum Units
2.3. Annotation Framework Based on Feature Decoupling
3. Experiments and Results
3.1. Dataset
3.2. Implementation Details
3.3. Evaluation Metrics
3.4. Ablation Studies on Annotation Strategies
3.5. Evaluation of Model Performance Improvement
4. Discussion
4.1. Analysis of Failure Cases
- (a)
- Over-segmentation issues: For adjacent linear defects with similar features and gradual transitions between segments, the segmentation-based annotation strategy may lead to over-segmentation, causing a single defect to be mistakenly identified as multiple independent segments. This issue was particularly evident in morphologically complex linear defects (e.g., Cr), indicating that the stability of the segmentation strategy still needs optimization.
- (b)
- Boundary ambiguity issues: When neighboring defects are closely spaced and the boundary features are not prominent, the model may exhibit inaccuracies in boundary localization, causing a single complete defect to be incorrectly divided into multiple parts. Although the proposed boundary extension strategy alleviated this issue to some extent, it remains difficult to fully avoid for densely distributed defects.
- (c)
- Boundary delineation deviation: In areas where the transition between the defect and the background is gradual, inconsistencies may arise between the detection result boundaries and the annotated labels. In such cases, even when using the boundary extension annotation strategy, it is challenging to ensure perfect alignment between the detection results and manually annotated boundaries, highlighting the need for further improvement in the strategy’s adaptability to complex backgrounds.
4.2. Analysis of Balance Between Accuracy and Annotation Cost
5. Conclusions
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Label | Cr | In | Pa | Ps | Rs | Sc | Total |
---|---|---|---|---|---|---|---|
Original | 689 | 981 | 875 | 430 | 608 | 525 | 4108 |
Ours | 2597 | 1453 | 1054 | 2279 | 3507 | 913 | 11,803 |
Item | Parameter | Value |
---|---|---|
Training parameters | Optimizer | Adam |
Batch size | 16 | |
Learning rate | 0.0001 | |
Epochs | 200 | |
Weight decay | 1 × 10−4 | |
Learning rate decay factor | 0.1 | |
Data augmentation | Random rotation | ±10° |
Random horizontal flip | Probability of 0.5 | |
Random vertical flip | Probability of 0.5 |
Strategy | AP (%) | (%) | (%) | AP | |||
---|---|---|---|---|---|---|---|
A | B | A | B | A | B | ||
Boundary Positioning Strategy | 84.9 | 89.6 | 86.6 | 87.3 | 81.9 | 88.4 | +2.7 |
Independent Unit Strategy for Block Defects | 68.8 | 75.4 | 75.4 | 83.8 | 66.1 | 71.7 | +6.6 |
Directional Segmentation Strategy for Linear Defects | 42.9 | 50.7 | 72.6 | 79.4 | 67.3 | 78.6 | +7.8 |
Local Window Strategy for Texture Defects | 79.1 | 80.3 | 85.3 | 84.6 | 89.8 | 90.1 | +1.2 |
Method | Labels | AP% | mAP% | |||||
---|---|---|---|---|---|---|---|---|
Cr | In | Pa | Ps | Rs | Sc | |||
Faster R-CNN | Original | 42.9 | 67.9 | 84.9 | 79.1 | 68.8 | 89.9 | 72.3 |
New | 50.7 | 76.5 | 89.6 | 80.3 | 75.4 | 95.3 | 78.0 | |
SSD | Original | 37.4 | 77.3 | 89.7 | 75.9 | 60.4 | 84.3 | 70.8 |
New | 46.3 | 79.6 | 93.9 | 78.8 | 64.8 | 88.1 | 75.3 | |
Cascade R-CNN | Original | 41.3 | 78.6 | 93.9 | 92.4 | 63.9 | 91.9 | 77.0 |
New | 51.8 | 82.4 | 94.1 | 93.1 | 71.2 | 93.6 | 81.0 | |
Deformable DETR | Original | 26.4 | 66.0 | 73.7 | 67.1 | 39.1 | 78.1 | 58.4 |
New | 40.2 | 73.1 | 89.6 | 70.2 | 56.4 | 83.8 | 68.9 | |
YOLOv8n | Original | 46.7 | 81.4 | 94.3 | 91.5 | 66.6 | 93.0 | 78.9 |
New | 49.1 | 82.7 | 95.4 | 90.9 | 68.4 | 94.8 | 80.2 | |
RT-DETR-R18 | Original | 47.9 | 78.7 | 96.0 | 91.4 | 67.6 | 94.2 | 79.3 |
New | 50.6 | 83.9 | 97.2 | 92.4 | 76.3 | 95.1 | 82.6 |
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Yuan, W.; Liu, W. Feature Decoupling-Guided Annotation Framework for Surface Defects on Steel Strips. Electronics 2025, 14, 2304. https://doi.org/10.3390/electronics14112304
Yuan W, Liu W. Feature Decoupling-Guided Annotation Framework for Surface Defects on Steel Strips. Electronics. 2025; 14(11):2304. https://doi.org/10.3390/electronics14112304
Chicago/Turabian StyleYuan, Weiqi, and Wentao Liu. 2025. "Feature Decoupling-Guided Annotation Framework for Surface Defects on Steel Strips" Electronics 14, no. 11: 2304. https://doi.org/10.3390/electronics14112304
APA StyleYuan, W., & Liu, W. (2025). Feature Decoupling-Guided Annotation Framework for Surface Defects on Steel Strips. Electronics, 14(11), 2304. https://doi.org/10.3390/electronics14112304