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Journal: Electronics, 2024
Volume: 13
Number: 1203
Article:
Highly Reliable Short-Circuit Protection Circuits for Gallium Nitride High-Electron-Mobility Transistors
Authors:
by
Chul-Min Kim, Hyun-Soo Yoon, Jong-Soo Kim and Nam-Joon Kim
Link:
https://www.mdpi.com/2079-9292/13/7/1203
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