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Journal: Electronics, 2024
Volume: 13
Number: 1203

Article: Highly Reliable Short-Circuit Protection Circuits for Gallium Nitride High-Electron-Mobility Transistors
Authors: by Chul-Min Kim, Hyun-Soo Yoon, Jong-Soo Kim and Nam-Joon Kim
Link: https://www.mdpi.com/2079-9292/13/7/1203

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