Ding, J.; Qian, P.; Ma, J.; Wang, Z.; Lu, Y.; Xie, X.
Detect Insider Threat with Associated Session Graph. Electronics 2024, 13, 4885.
https://doi.org/10.3390/electronics13244885
AMA Style
Ding J, Qian P, Ma J, Wang Z, Lu Y, Xie X.
Detect Insider Threat with Associated Session Graph. Electronics. 2024; 13(24):4885.
https://doi.org/10.3390/electronics13244885
Chicago/Turabian Style
Ding, Junmei, Peng Qian, Jing Ma, Zhiqiang Wang, Yueming Lu, and Xiaqing Xie.
2024. "Detect Insider Threat with Associated Session Graph" Electronics 13, no. 24: 4885.
https://doi.org/10.3390/electronics13244885
APA Style
Ding, J., Qian, P., Ma, J., Wang, Z., Lu, Y., & Xie, X.
(2024). Detect Insider Threat with Associated Session Graph. Electronics, 13(24), 4885.
https://doi.org/10.3390/electronics13244885