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Journal: Electronics, 2024
Volume: 13
Number: 4495
Article:
Research on Typical Decay-like Fracture Defects of Composite Insulators Based on Electro-Thermal Coupling
Authors:
by
Weihui Xu, Wenbo Li, Wenjie Jiang, Shuailong Li and Weishu Wang
Link:
https://www.mdpi.com/2079-9292/13/22/4495
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