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Journal: Electronics, 2024
Volume: 13
Number: 284

Article: AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection
Authors: by Yongxian Song, Wenhao Xia, Yuanyuan Li, Hao Li, Minfeng Yuan and Qi Zhang
Link: https://www.mdpi.com/2079-9292/13/2/284

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