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Electronics2024, 13(2), 284;https://doi.org/10.3390/electronics13020284

Journal: ElectronicsVolume: 13Number: 284

Article: AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection

Authors:
Yongxian Song^1,2,
Wenhao Xia^2,* and
Yuanyuan Li²
et al.

Link: https://www.mdpi.com/2079-9292/13/2/284

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