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Journal: Electronics, 2024
Volume: 13
Number: 284
Article:
AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection
Authors:
by
Yongxian Song, Wenhao Xia, Yuanyuan Li, Hao Li, Minfeng Yuan and Qi Zhang
Link:
https://www.mdpi.com/2079-9292/13/2/284
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