Next Article in Journal
Generative AI-Driven Data Augmentation for Crack Detection in Physical Structures
Previous Article in Journal
On-State Voltage Measurement Circuit for Condition Monitoring of MOSFETs in Resonant Converters
 
 
Article

Article Versions Notes

Electronics 2024, 13(19), 3904; https://doi.org/10.3390/electronics13193904
Action Date Notes Link
article xml file uploaded 2 October 2024 11:36 CEST Original file -
article xml uploaded. 2 October 2024 11:36 CEST Update -
article pdf uploaded. 2 October 2024 11:36 CEST Version of Record https://www.mdpi.com/2079-9292/13/19/3904/pdf-vor
article html file updated 2 October 2024 11:38 CEST Original file -
article xml file uploaded 9 October 2024 10:14 CEST Update -
article xml uploaded. 9 October 2024 10:14 CEST Update -
article pdf uploaded. 9 October 2024 10:14 CEST Updated version of record https://www.mdpi.com/2079-9292/13/19/3904/pdf-vor
article html file updated 9 October 2024 10:16 CEST Update -
Correction published 21 November 2024 00:00 CET Correction https://www.mdpi.com/2079-9292/13/23/4588
article pdf uploaded. 21 November 2024 11:42 CET Updated version of record https://www.mdpi.com/2079-9292/13/19/3904/pdf
article xml uploaded. 21 November 2024 11:42 CET Update -
article xml uploaded. 21 November 2024 11:42 CET Update https://www.mdpi.com/2079-9292/13/19/3904/xml
article html file updated 21 November 2024 11:44 CET Update https://www.mdpi.com/2079-9292/13/19/3904/html
Back to TopTop