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Journal: Electronics, 2024
Volume: 13
Number: 3506
Article:
Frequent Power-Up-and-Down-Induced Degradation of Device and Bandgap Voltage Reference in 14-nm FinFET Technology
Authors:
by
Yiqun Shi, Yunpeng Li, Meng Li, Xin Xu, Hao Zhu and Qingqing Sun
Link:
https://www.mdpi.com/2079-9292/13/17/3506
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