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Kumar Y, Huang K, Perez A, Yang G, Li JJ, Morreale P, Kruger D, Jiang R. Bias and Cyberbullying Detection and Data Generation Using Transformer Artificial Intelligence Models and Top Large Language Models. Electronics. 2024; 13(17):3431. https://doi.org/10.3390/electronics13173431

Kumar, Yulia, Kuan Huang, Angelo Perez, Guohao Yang, J. Jenny Li, Patricia Morreale, Dov Kruger, and Raymond Jiang. 2024. "Bias and Cyberbullying Detection and Data Generation Using Transformer Artificial Intelligence Models and Top Large Language Models" Electronics 13, no. 17: 3431. https://doi.org/10.3390/electronics13173431

Kumar, Y., Huang, K., Perez, A., Yang, G., Li, J. J., Morreale, P., Kruger, D., & Jiang, R. (2024). Bias and Cyberbullying Detection and Data Generation Using Transformer Artificial Intelligence Models and Top Large Language Models. Electronics, 13(17), 3431. https://doi.org/10.3390/electronics13173431