Rail Surface Defect Detection Based on Dual-Path Feature Fusion
Abstract
:1. Introduction
- This study proposes a steel rail surface defect detection model based on dual-path feature fusion (DPF). The model is designed with two distinct paths to separately extract low-level and high-level features. By utilizing an attention mechanism and feature fusion, these features are integrated, preserving richer information and enhancing the accuracy and robustness of detection.
- The Dy-Bottleneck module is proposed in this paper, which incorporates a dual-path structure combining two parallel and interactive dynamic convolutions. This module dynamically adjusts based on the characteristics of the input data, allowing it to adapt to diverse datasets and complex scenarios.
- A symmetric feature attention fusion module is introduced in this study. This module combines the lightweight Convolutional Block Attention Module (CBAM) with the symmetric design of the feature pyramid network (FPN). Specifically, CBAM attention and FPN structures are employed in both the feature extraction and feature fusion stages. This symmetric design makes the module more compact and consistent, enhancing the model’s understanding and recognition ability of images for better performance.
2. Related Work
2.1. Dynamic Convolution
2.2. Convolutional Block Attention Module
2.3. Feature Pyramid
3. Methods
3.1. Overall Structure
3.2. Dy-Bottleneck Module
3.3. Symmetric Feature Attention Fusion Module
3.4. Detection Head
3.5. Loss Function
- (1)
- Classification Loss
- (2)
- Confidence Loss
- (3)
- Location Loss
4. Experimental Results
4.1. Datasets
4.2. Evaluation Indicators or Evaluation Metrics
4.3. Experimental Parameter Settings
4.4. Experimental Results
- (1)
- Ablation Experiment
- (2)
- Visualization Result Analysis
- (3)
- Comparative Experiments with Mainstream Models
5. Conclusions
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Main Modules | Input (Dual-Path) Size Dimensions | Output (Dual-Path) Size Dimensions | Quantity |
---|---|---|---|
Max pooling | 640 × 640 × 3 | 320 × 320 × 64 | 1 |
Conv 2D | 320 × 320 × 64 | 160 × 160 × 128 | 1 |
Dy-Bottleneck (F) | 160 × 160 × 128 | 160 × 160 × 128 and 80 × 80 × 128 | 1 |
Dy-Bottleneck (M) 1st | 160 × 160 × 128 and 80 × 80 × 128 | 160 × 160 × 128 and 80 × 80 × 128 | 2 |
Dy-Bottleneck (M) 2nd | 160 × 160 × 128 and 80 × 80 × 128 | 80 × 80 × 256 and 40 × 40 × 256 | 4 |
Dy-Bottleneck (M) 3rd | 80 × 80 × 256 and 40 × 40 × 256 | 40 × 40 × 512 and 20 × 20 × 512 | 4 |
Dy-Bottleneck (M) 4th | 40 × 40 × 512 and 20 × 20 × 512 | 40 × 40 × 512 and 20 × 20 × 512 | 2 |
Dy-Bottleneck (L) | 40 × 40 × 512 and 20 × 20 × 512 | 20 × 20 × 1024 | 1 |
No | Dual-Path Backbone | Dynamic Convolution | Symmetric Attention | CBAM | P (%) | R (%) | mAP@0.5 (%) |
---|---|---|---|---|---|---|---|
1 | × | × | × | × | 68.4 | 70.2 | 71.5 |
2 | × | × | √ | × | 73.2 | 65.1 | 71.4 |
3 | × | × | √ | √ | 87.4 | 68.0 | 72.5 |
4 | √ | × | √ | √ | 91.5 | 93.6 | 97.2 |
5 | √ | √ | × | √ | 93.8 | 95.8 | 97.3 |
6 | √ | √ | √ | × | 94.1 | 94.1 | 97.3 |
7 | √ | √ | √ | √ | 97.5 | 93.8 | 98.3 |
Model | P (%) | R (%) | mAP0.5 (%) | ||||||
---|---|---|---|---|---|---|---|---|---|
Defect | Dirt | Gap | Defect | Dirt | Gap | Defect | Dirt | Gap | |
SSD [37] | 68.4 | 63.3 | 87.4 | 70.2 | 67.1 | 58.0 | 71.5 | 69.9 | 72.8 |
Faster R-CNN [38] | 85.7 | 87.1 | 89.7 | 80.8 | 78.7 | 79.1 | 86.2 | 86.5 | 87.2 |
YOLOv3-tiny [39] | 90.1 | 90.6 | 91.3 | 82.9 | 83.2 | 83.0 | 88.8 | 90.1 | 89.7 |
YOLOv4 [40] | 92.3 | 91.6 | 93.2 | 87.89 | 89.86 | 90.89 | 90.55 | 90.34 | 90.89 |
YOLOv5s [41] | 91.4 | 83.3 | 87.3 | 91.6 | 90.7 | 92.75 | 91.3 | 91.6 | 94.4 |
YOLOv8n [42] | 91.5 | 89.8 | 100 | 93.6 | 94.1 | 99.8 | 97.2 | 95.3 | 99.5 |
DETR [43] | 98.1 | 91.0 | 95.8 | 94.4 | 94.1 | 95.8 | 98.3 | 97.3 | 99.0 |
DPF | 98.6 | 94.1 | 100 | 94.5 | 94.1 | 92.7 | 98.3 | 97.3 | 99.2 |
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Zhong, Y.; Chen, G. Rail Surface Defect Detection Based on Dual-Path Feature Fusion. Electronics 2024, 13, 2564. https://doi.org/10.3390/electronics13132564
Zhong Y, Chen G. Rail Surface Defect Detection Based on Dual-Path Feature Fusion. Electronics. 2024; 13(13):2564. https://doi.org/10.3390/electronics13132564
Chicago/Turabian StyleZhong, Yinfeng, and Guorong Chen. 2024. "Rail Surface Defect Detection Based on Dual-Path Feature Fusion" Electronics 13, no. 13: 2564. https://doi.org/10.3390/electronics13132564
APA StyleZhong, Y., & Chen, G. (2024). Rail Surface Defect Detection Based on Dual-Path Feature Fusion. Electronics, 13(13), 2564. https://doi.org/10.3390/electronics13132564