Order Article Reprints

Zhang J, Luo H, Wu H, Zheng B, Chen X, Zhang G, French P, Wang S. RETRACTED: Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics. 2024; 13(12):2347. https://doi.org/10.3390/electronics13122347

Zhang, Jingping, Houcai Luo, Huan Wu, Bofeng Zheng, Xianping Chen, Guoqi Zhang, Paddy French, and Shaogang Wang. 2024. "RETRACTED: Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study" Electronics 13, no. 12: 2347. https://doi.org/10.3390/electronics13122347

Zhang, J., Luo, H., Wu, H., Zheng, B., Chen, X., Zhang, G., French, P., & Wang, S. (2024). RETRACTED: Effects of Current Filaments on IGBT Avalanche Robustness: A Simulation Study. Electronics, 13(12), 2347. https://doi.org/10.3390/electronics13122347