Zhu, H.;                     Wang, H.;                     Zhang, H.;                     Wang, N.;                     Ren, Q.;                     Chen, Y.;                     Liu, F.;                     Gao, J.    
        A Surrogate Model for the Rapid Evaluation of Electromagnetic-Thermal Effects under Humid Air Conditions. Electronics 2024, 13, 2336.
    https://doi.org/10.3390/electronics13122336
    AMA Style
    
                                Zhu H,                                 Wang H,                                 Zhang H,                                 Wang N,                                 Ren Q,                                 Chen Y,                                 Liu F,                                 Gao J.        
                A Surrogate Model for the Rapid Evaluation of Electromagnetic-Thermal Effects under Humid Air Conditions. Electronics. 2024; 13(12):2336.
        https://doi.org/10.3390/electronics13122336
    
    Chicago/Turabian Style
    
                                Zhu, Hui,                                 Hui Wang,                                 Han Zhang,                                 Nan Wang,                                 Qiang Ren,                                 Yanning Chen,                                 Fang Liu,                                 and Jie Gao.        
                2024. "A Surrogate Model for the Rapid Evaluation of Electromagnetic-Thermal Effects under Humid Air Conditions" Electronics 13, no. 12: 2336.
        https://doi.org/10.3390/electronics13122336
    
    APA Style
    
                                Zhu, H.,                                 Wang, H.,                                 Zhang, H.,                                 Wang, N.,                                 Ren, Q.,                                 Chen, Y.,                                 Liu, F.,                                 & Gao, J.        
        
        (2024). A Surrogate Model for the Rapid Evaluation of Electromagnetic-Thermal Effects under Humid Air Conditions. Electronics, 13(12), 2336.
        https://doi.org/10.3390/electronics13122336