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Journal: Electronics, 2023
Volume: 12
Number: 1487
Article:
NS-GAAFET Compact Modeling: Technological Challenges in Sub-3-nm Circuit Performance
Authors:
by
Fabrizio Mo, Chiara Elfi Spano, Yuri Ardesi, Massimo Ruo Roch, Gianluca Piccinini and Marco Vacca
Link:
https://www.mdpi.com/2079-9292/12/6/1487
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