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Journal: Electronics, 2023
Volume: 12
Number: 1487

Article: NS-GAAFET Compact Modeling: Technological Challenges in Sub-3-nm Circuit Performance
Authors: by Fabrizio Mo, Chiara Elfi Spano, Yuri Ardesi, Massimo Ruo Roch, Gianluca Piccinini and Marco Vacca
Link: https://www.mdpi.com/2079-9292/12/6/1487

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