Mo, F.; Spano, C.E.; Ardesi, Y.; Ruo Roch, M.; Piccinini, G.; Vacca, M.
NS-GAAFET Compact Modeling: Technological Challenges in Sub-3-nm Circuit Performance. Electronics 2023, 12, 1487.
https://doi.org/10.3390/electronics12061487
AMA Style
Mo F, Spano CE, Ardesi Y, Ruo Roch M, Piccinini G, Vacca M.
NS-GAAFET Compact Modeling: Technological Challenges in Sub-3-nm Circuit Performance. Electronics. 2023; 12(6):1487.
https://doi.org/10.3390/electronics12061487
Chicago/Turabian Style
Mo, Fabrizio, Chiara Elfi Spano, Yuri Ardesi, Massimo Ruo Roch, Gianluca Piccinini, and Marco Vacca.
2023. "NS-GAAFET Compact Modeling: Technological Challenges in Sub-3-nm Circuit Performance" Electronics 12, no. 6: 1487.
https://doi.org/10.3390/electronics12061487
APA Style
Mo, F., Spano, C. E., Ardesi, Y., Ruo Roch, M., Piccinini, G., & Vacca, M.
(2023). NS-GAAFET Compact Modeling: Technological Challenges in Sub-3-nm Circuit Performance. Electronics, 12(6), 1487.
https://doi.org/10.3390/electronics12061487