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Journal: Electronics, 2023
Volume: 12
Number: 933
Article:
An Improved Algorithm for Insulator and Defect Detection Based on YOLOv4
Authors:
by
Gujing Han, Qiwei Yuan, Feng Zhao, Ruijie Wang, Liu Zhao, Saidian Li, Min He, Shiqi Yang and Liang Qin
Link:
https://www.mdpi.com/2079-9292/12/4/933
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