Rubio, L.; Peñarrocha, V.M.R.; Cabedo-Fabres, M.; Bernardo-Clemente, B.; Reig, J.; Fernández, H.; Pérez, J.R.; Torres, R.P.; Valle, L.; Fernández, Ó.
Millimeter-Wave Channel Measurements and Path Loss Characterization in a Typical Indoor Office Environment. Electronics 2023, 12, 844.
https://doi.org/10.3390/electronics12040844
AMA Style
Rubio L, Peñarrocha VMR, Cabedo-Fabres M, Bernardo-Clemente B, Reig J, Fernández H, Pérez JR, Torres RP, Valle L, Fernández Ó.
Millimeter-Wave Channel Measurements and Path Loss Characterization in a Typical Indoor Office Environment. Electronics. 2023; 12(4):844.
https://doi.org/10.3390/electronics12040844
Chicago/Turabian Style
Rubio, Lorenzo, Vicent M. Rodrigo Peñarrocha, Marta Cabedo-Fabres, Bernardo Bernardo-Clemente, Juan Reig, Herman Fernández, Jesús R. Pérez, Rafael P. Torres, Luis Valle, and Óscar Fernández.
2023. "Millimeter-Wave Channel Measurements and Path Loss Characterization in a Typical Indoor Office Environment" Electronics 12, no. 4: 844.
https://doi.org/10.3390/electronics12040844
APA Style
Rubio, L., Peñarrocha, V. M. R., Cabedo-Fabres, M., Bernardo-Clemente, B., Reig, J., Fernández, H., Pérez, J. R., Torres, R. P., Valle, L., & Fernández, Ó.
(2023). Millimeter-Wave Channel Measurements and Path Loss Characterization in a Typical Indoor Office Environment. Electronics, 12(4), 844.
https://doi.org/10.3390/electronics12040844