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Journal: Electronics, 2023
Volume: 12
Number: 1049

Article: Correlation of Crystal Defects with Device Performance of AlGaN/GaN High-Electron-Mobility Transistors Fabricated on Silicon and Sapphire Substrates
Authors: by Sakhone Pharkphoumy, Vallivedu Janardhanam, Tae-Hoon Jang, Kyu-Hwan Shim and Chel-Jong Choi
Link: https://www.mdpi.com/2079-9292/12/4/1049

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