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Journal: Electronics, 2023
Volume: 12
Number: 4863
Article:
A Novel Relocalization Method-Based Dynamic Steel Billet Flaw Detection and Marking System
Authors:
by
Hongxing Zhou, Juan Chen, Qinghan Hu, Xue Zhao and Zhiqing Li
Link:
https://www.mdpi.com/2079-9292/12/23/4863
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