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Journal: Electronics, 2023
Volume: 12
Number: 4853
Article:
BPath-RO: A Performance- and Area-Efficient In Situ Delay Measurement Scheme for Digital IC
Authors:
by
Danqing Li, Huaguo Liang, Hong Zhang, Yue Wang, Maoxiang Yi, Yingchun Lu and Zhengfeng Huang
Link:
https://www.mdpi.com/2079-9292/12/23/4853
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