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Journal: Electronics, 2023
Volume: 12
Number: 4138

Article: TEM Strata Inversion Imaging with IP Effect Based on Enhanced GCN by Extracting Long-Dependency Features
Authors: by Ruiheng Li, Yi Di, Hao Tian and Lu Gan
Link: https://www.mdpi.com/2079-9292/12/19/4138

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