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Journal: Electronics, 2023
Volume: 12
Number: 3471
Article:
A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part I: Thermometer-Based Approaches
Authors:
by
Vincenzo d’Alessandro, Antonio Pio Catalano, Ciro Scognamillo, Markus Müller, Michael Schröter, Peter J. Zampardi and Lorenzo Codecasa
Link:
https://www.mdpi.com/2079-9292/12/16/3471
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