Three-Phase Inverter Fault Diagnosis Based on an Improved Deep Residual Network
Abstract
:1. Introduction
- Utilizing a CVAE model, we extract latent information from the original samples in order and generate new samples to augment the number of samples.
- To leverage the superior feature extraction capability of convolutional neural networks (CNNs), we employ a sample normalization technique to convert the sample data into 2D grayscale images. This approach offers a novel method for processing inverter sample.
- We introduce a channel attention mechanism into a deep residual network to improve the extraction of fault features. This method achieves higher accuracy and faster model convergence compared to the residual network.
2. Deep Residual Network
3. The Proposed Method
3.1. Research Method
3.2. Fault Sample Processing
3.2.1. Failure Mode Analysis
- Normal;
- Single-transistor failure;
- Two power transistors failures in a cross-half bridge;
- Two power transistors failures in a single-phase bridge;
- Two power transistors failures in the same half bridge.
3.2.2. Fault Sample Enhancement
3.2.3. Wavelet Packet Decomposition Denoising
3.2.4. Faulty Sample Preprocessing
3.3. Fault Diagnosis Model Based on a Deep Residual Network
3.3.1. Channel Attention Module
3.3.2. Activation Function
3.3.3. Model Structure
4. Experimental Verifications
4.1. Sample Enhancement Experiment
4.2. Improved Deep Residual Network Fault Diagnosis Experiment
5. Conclusions
6. Discussion
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
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Normal and Single-Transistor Fault | Corresponding Category | Double-Transistor Fault | Corresponding Category |
---|---|---|---|
Normal | 0 | 1#, 2# | 2 |
1# | 1 | 1#, 3# | 3 |
2# | 7 | 1#, 4# | 4 |
3# | 12 | 1#, 5# | 5 |
4# | 16 | 1#, 6# | 6 |
5# | 19 | 2#, 3# | 8 |
6# | 21 | 2#, 4# | 9 |
2#, 5# | 10 | ||
2#, 6# | 11 | ||
3#, 4# | 13 | ||
3#, 5# | 14 | ||
3#, 6# | 15 | ||
4#, 5# | 17 | ||
4#, 6# | 18 | ||
5#, 6# | 20 |
Models | BPNN | LeNet5 | ResNet18 | SE-ResNet18 | ||||
---|---|---|---|---|---|---|---|---|
Layer | Number of Neurons | Layer | Kernel Size/Number of Neurons | Layer | Kernel Size/Number of Neurons | Layer | Kernel Size/Number of Neurons | |
Structure/ Parameters | Full Connect Layer | 200 | Conv Layer | 7 × 7 × 32 | Conv Layer | 7 × 7 × 64 | Conv Layer | 7 × 7 × 64 |
5 × 5 × 48 | Res Block | [3 × 3 × 64] × 2 | SERes Block | [3 × 3 × 64] × 2 | ||||
80 | Full Connect Layer | 64 | [3 × 3 × 128] × 2 | [3 × 3 × 128] × 2 | ||||
[3 × 3 × 256] × 2 | [3 × 3 × 256] × 2 | |||||||
32 | [3 × 3 × 512] × 2 | [3 × 3 × 512] × 2 | ||||||
Full Connect Layer | 22 | Full Connect Layer | 22 | |||||
22 | 22 | |||||||
Softmax Layer |
Models | ResBlock | SEResBlock | ||
---|---|---|---|---|
Layer | Kernel Size | Layer | Number of Neuron | |
Structure/ Parameters | Conv Layer | 3 × 3 × 64 | ResBlock Start | |
BatchNormalization Layer | GlobalAveragePooling Layer | |||
LeakyRelu Layer | FullyConnected Layer | 16 | ||
Conv Layer | 3 × 3 × 64 | LeakyRelu Layer | ||
BatchNormalization Layer | FullyConnected Layer | 64 | ||
Addition Layer | Sigmoid Layer | |||
Multiplication Layer | ||||
ResBlock End |
Models | Original Dataset Testing Accuracy | Enhanced Dataset Testing Accuracy |
---|---|---|
BPNN | 90.00% | 91.36% |
LeNet5 | 92.72% | 94.09% |
ResNet18 | 97.27% | 98.33% |
SE-ResNet18 | 98.18% | 100% |
Models | Fold 1 | Fold 2 | Fold 3 | Fold 4 | Fold 5 | Average Accuracy |
---|---|---|---|---|---|---|
BPNN | 89.09% | 91.82% | 90.00% | 90.91% | 89.09% | 90.18% |
LeNet5 | 92.73% | 93.64% | 91.82% | 93.64% | 92.73% | 92.91% |
ResNet18 | 95.45% | 96.36% | 95.45% | 96.36% | 94.55% | 95.64% |
SE-ResNet18 | 99.09% | 98.18% | 98.18% | 99.09% | 100.00% | 98.91% |
Models | Fold 1 | Fold 2 | Fold 3 | Fold 4 | Fold 5 | Average Accuracy |
---|---|---|---|---|---|---|
BPNN | 91.36% | 91.14% | 91.36% | 90.68% | 91.59% | 91.23% |
LeNet5 | 94.32% | 94.55% | 94.77% | 94.55% | 94.32% | 94.50% |
ResNet18 | 97.95% | 97.73% | 97.50% | 98.41% | 98.18% | 97.95% |
SE-ResNet18 | 100.00% | 100.00% | 99.77% | 99.55% | 100.00% | 99.86% |
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Fu, Y.; Ji, Y.; Meng, G.; Chen, W.; Bai, X. Three-Phase Inverter Fault Diagnosis Based on an Improved Deep Residual Network. Electronics 2023, 12, 3460. https://doi.org/10.3390/electronics12163460
Fu Y, Ji Y, Meng G, Chen W, Bai X. Three-Phase Inverter Fault Diagnosis Based on an Improved Deep Residual Network. Electronics. 2023; 12(16):3460. https://doi.org/10.3390/electronics12163460
Chicago/Turabian StyleFu, Yanfang, Yu Ji, Gong Meng, Wei Chen, and Xiaojun Bai. 2023. "Three-Phase Inverter Fault Diagnosis Based on an Improved Deep Residual Network" Electronics 12, no. 16: 3460. https://doi.org/10.3390/electronics12163460
APA StyleFu, Y., Ji, Y., Meng, G., Chen, W., & Bai, X. (2023). Three-Phase Inverter Fault Diagnosis Based on an Improved Deep Residual Network. Electronics, 12(16), 3460. https://doi.org/10.3390/electronics12163460