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Journal: Electronics, 2023
Volume: 12
Number: 3307
Article:
Tunnel Lining Crack Recognition Algorithm Integrating SK Attention and Cascade Neural Network
Authors:
by
Keqiang Liu, Shisheng Zhong, Rui Wang, Peiying Zhou, Xiaodong Zhao and Xingen Liu
Link:
https://www.mdpi.com/2079-9292/12/15/3307
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