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Journal: Electronics, 2023
Volume: 12
Number: 3182

Article: Vertical Federated Unlearning on the Logistic Regression Model
Authors: by Zihao Deng, Zhaoyang Han, Chuan Ma, Ming Ding, Long Yuan, Chunpeng Ge and Zhe Liu
Link: https://www.mdpi.com/2079-9292/12/14/3182

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