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Journal: Electronics, 2023
Volume: 12
Number: 3139

Article: Support Vector Regression Model for Determining Optimal Parameters of HfAlO-Based Charge Trapping Memory Devices
Authors: by Yifan Hu, Fucheng Wang, Jingwen Chen, Suresh Kumar Dhungel, Xinying Li, Jang-Kun Song, Yong-Sang Kim, Duy Phong Pham and Junsin Yi
Link: https://www.mdpi.com/2079-9292/12/14/3139

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