Kumar, Y.; Morreale, P.; Sorial, P.; Delgado, J.; Li, J.J.; Martins, P.
A Testing Framework for AI Linguistic Systems (testFAILS). Electronics 2023, 12, 3095.
https://doi.org/10.3390/electronics12143095
AMA Style
Kumar Y, Morreale P, Sorial P, Delgado J, Li JJ, Martins P.
A Testing Framework for AI Linguistic Systems (testFAILS). Electronics. 2023; 12(14):3095.
https://doi.org/10.3390/electronics12143095
Chicago/Turabian Style
Kumar, Yulia, Patricia Morreale, Peter Sorial, Justin Delgado, J. Jenny Li, and Patrick Martins.
2023. "A Testing Framework for AI Linguistic Systems (testFAILS)" Electronics 12, no. 14: 3095.
https://doi.org/10.3390/electronics12143095
APA Style
Kumar, Y., Morreale, P., Sorial, P., Delgado, J., Li, J. J., & Martins, P.
(2023). A Testing Framework for AI Linguistic Systems (testFAILS). Electronics, 12(14), 3095.
https://doi.org/10.3390/electronics12143095