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Journal: Electronics, 2023
Volume: 12
Number: 3075
Article:
A Multi-Feature Fusion-Based Automatic Detection Method for High-Severity Defects
Authors:
by
Jie Liu, Cangming Liang, Jintao Feng, Anhong Xiao, Hui Zeng, Qujin Wu and Tonglan Yu
Link:
https://www.mdpi.com/2079-9292/12/14/3075
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