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Journal: Electronics, 2023
Volume: 12
Number: 2891

Article: Comparison of Gamma Irradiation Effects on Short Circuit Characteristics of SiC MOSFET Power Devices between Planar and Trench Structures
Authors: by Lei Shu, Huai-Lin Liao, Zi-Yuan Wu, Yan-Yan Li, Xing-Yu Fang, Shi-Wei Liang, Tong-De Li, Liang Wang, Jun Wang and Yuan-Fu Zhao
Link: https://www.mdpi.com/2079-9292/12/13/2891

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