A Carrier Synchronization Lock Detector Based on Weighted Detection Statistics for APSK Signals
Abstract
:1. Introduction
- (1)
- Based on detection statistics used in the Linn detector, the proposed method weights the detection statistics according to the difference in signal amplitude on different rings of APSK constellation and generates a new detection statistic.
- (2)
- The expectation and variance of the detection statistics in the two states of carrier synchronization (lock and unlock) are analyzed theoretically.
- (3)
- The lock-detection probability and false-alarm probability of the proposed detection method are analyzed.
2. Signal Model
3. Methodology
4. Performance Analysis
4.1. Expectation and Variance
4.2. Lock Detection Probability
5. Numerical Results
5.1. Expectation and Variace
5.2. Lock Detection Probability
6. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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Parameters | 16APSK | 32APSK |
---|---|---|
2 | 3 | |
[4,12] | [4,12,16] | |
[4,12] | [4,12,16] | |
[1.41,3] | [1.41,3,5] | |
2.21 | [2.21,4] | |
[0.18,0.82] | [0.06,0.25,0.69] | |
(sps) | 1000 | 1000 |
(Hz) | 16,000 | 16,000 |
Roll-off factor | 0.25 | 0.25 |
(dB) | 0~30 | 0~30 |
Simulation time(s) | 0.0639 | 0.0639 |
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Li, Y.; Shi, X.; Zhan, J.; Wang, Y. A Carrier Synchronization Lock Detector Based on Weighted Detection Statistics for APSK Signals. Electronics 2023, 12, 119. https://doi.org/10.3390/electronics12010119
Li Y, Shi X, Zhan J, Wang Y. A Carrier Synchronization Lock Detector Based on Weighted Detection Statistics for APSK Signals. Electronics. 2023; 12(1):119. https://doi.org/10.3390/electronics12010119
Chicago/Turabian StyleLi, Yaoyao, Xuesen Shi, Jie Zhan, and Yongqing Wang. 2023. "A Carrier Synchronization Lock Detector Based on Weighted Detection Statistics for APSK Signals" Electronics 12, no. 1: 119. https://doi.org/10.3390/electronics12010119
APA StyleLi, Y., Shi, X., Zhan, J., & Wang, Y. (2023). A Carrier Synchronization Lock Detector Based on Weighted Detection Statistics for APSK Signals. Electronics, 12(1), 119. https://doi.org/10.3390/electronics12010119