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Journal: Electronics, 2022
Volume: 11
Number: 727
727
Article:
Scalable Path Search for Automated Test Case Generation
Authors:
by
Enze Ma, Xiufeng Fu and Xi Wang
Link:
https://www.mdpi.com/2079-9292/11/5/727
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Cite
Ma, E.; Fu, X.; Wang, X. Scalable Path Search for Automated Test Case Generation. Electronics 2022, 11, 727. https://doi.org/10.3390/electronics11050727
Ma E, Fu X, Wang X. Scalable Path Search for Automated Test Case Generation. Electronics. 2022; 11(5):727. https://doi.org/10.3390/electronics11050727
Chicago/Turabian StyleMa, Enze, Xiufeng Fu, and Xi Wang. 2022. "Scalable Path Search for Automated Test Case Generation" Electronics 11, no. 5: 727. https://doi.org/10.3390/electronics11050727
APA StyleMa, E., Fu, X., & Wang, X. (2022). Scalable Path Search for Automated Test Case Generation. Electronics, 11(5), 727. https://doi.org/10.3390/electronics11050727