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Journal: Electronics, 2022
Volume: 11
Number: 4211

Article: YOLO-RFF: An Industrial Defect Detection Method Based on Expanded Field of Feeling and Feature Fusion
Authors: by Gang Li, Shilong Zhao, Mingle Zhou, Min Li, Rui Shao, Zekai Zhang and Delong Han
Link: https://www.mdpi.com/2079-9292/11/24/4211

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