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        Journal: Electronics, 2022
        Volume: 11 
                	Number: 4051 
                
        
        Article:
        Probabilistic Analysis of an RL Circuit Transient Response under Inductor Failure Conditions 
        Authors: 
       	by
                    Muhammad Farooq-i-Azam, Zeashan Hameed Khan, Syed Raheel Hassan and Rameez Asif        
        Link:
        https://www.mdpi.com/2079-9292/11/23/4051
        
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