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Journal: Electronics, 2022
Volume: 11
Number: 4051
Article:
Probabilistic Analysis of an RL Circuit Transient Response under Inductor Failure Conditions
Authors:
by
Muhammad Farooq-i-Azam, Zeashan Hameed Khan, Syed Raheel Hassan and Rameez Asif
Link:
https://www.mdpi.com/2079-9292/11/23/4051
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