Dai, Y.; Yang, Y.; Jiang, N.; Qi, P.; Chen, Q.; Tong, J.
A High Performance and Low Power Triple-Node-Upset Self-Recoverable Latch Design. Electronics 2022, 11, 3606.
https://doi.org/10.3390/electronics11213606
AMA Style
Dai Y, Yang Y, Jiang N, Qi P, Chen Q, Tong J.
A High Performance and Low Power Triple-Node-Upset Self-Recoverable Latch Design. Electronics. 2022; 11(21):3606.
https://doi.org/10.3390/electronics11213606
Chicago/Turabian Style
Dai, Yanyun, Yanfei Yang, Nan Jiang, Pengjia Qi, Qi Chen, and Jijun Tong.
2022. "A High Performance and Low Power Triple-Node-Upset Self-Recoverable Latch Design" Electronics 11, no. 21: 3606.
https://doi.org/10.3390/electronics11213606
APA Style
Dai, Y., Yang, Y., Jiang, N., Qi, P., Chen, Q., & Tong, J.
(2022). A High Performance and Low Power Triple-Node-Upset Self-Recoverable Latch Design. Electronics, 11(21), 3606.
https://doi.org/10.3390/electronics11213606