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Journal: Electronics, 2022
Volume: 11
Number: 2763
Article:
Defect Synthesis Using Latent Mapping Adversarial Network for Automated Visual Inspection
Authors:
by
Seunghwan Song, Kyuchang Chang, Kio Yun, Changdong Jun and Jun-Geol Baek
Link:
https://www.mdpi.com/2079-9292/11/17/2763
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