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Journal: Electronics, 2022
Volume: 11
Number: 2382

Article: ASPDC: Accelerated SPDC Regularized Empirical Risk Minimization for Ill-Conditioned Problems in Large-Scale Machine Learning
Authors: by Haobang Liang, Hao Cai, Hejun Wu, Fanhua Shang, James Cheng and Xiying Li
Link: https://www.mdpi.com/2079-9292/11/15/2382

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