Next Article in Journal
Asynchronous and Decoupled HIL Simulation of a DC Nanogrid
Previous Article in Journal
TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials
 
 
Article

Article Versions Notes

Electronics 2022, 11(13), 2046; https://doi.org/10.3390/electronics11132046
Action Date Notes Link
article pdf uploaded. 29 June 2022 15:09 CEST Version of Record https://www.mdpi.com/2079-9292/11/13/2046/pdf-vor
article pdf uploaded. 29 June 2022 16:02 CEST Updated version of record https://www.mdpi.com/2079-9292/11/13/2046/pdf-vor
article xml file uploaded 4 July 2022 04:20 CEST Original file -
article xml uploaded. 4 July 2022 04:20 CEST Update -
article pdf uploaded. 4 July 2022 04:20 CEST Updated version of record https://www.mdpi.com/2079-9292/11/13/2046/pdf-vor
article html file updated 4 July 2022 04:21 CEST Original file -
article html file updated 4 July 2022 10:03 CEST Update -
article xml file uploaded 7 July 2022 06:18 CEST Update -
article xml uploaded. 7 July 2022 06:18 CEST Update https://www.mdpi.com/2079-9292/11/13/2046/xml
article pdf uploaded. 7 July 2022 06:18 CEST Updated version of record https://www.mdpi.com/2079-9292/11/13/2046/pdf
article html file updated 7 July 2022 06:19 CEST Update -
article html file updated 12 August 2022 23:17 CEST Update https://www.mdpi.com/2079-9292/11/13/2046/html
Back to TopTop