Shao, J.;                     Song, R.;                     Chi, Y.;                     Liang, B.;                     Wu, Z.    
        TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials. Electronics 2022, 11, 2043.
    https://doi.org/10.3390/electronics11132043
    AMA Style
    
                                Shao J,                                 Song R,                                 Chi Y,                                 Liang B,                                 Wu Z.        
                TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials. Electronics. 2022; 11(13):2043.
        https://doi.org/10.3390/electronics11132043
    
    Chicago/Turabian Style
    
                                Shao, Jinjin,                                 Ruiqiang Song,                                 Yaqing Chi,                                 Bin Liang,                                 and Zhenyu Wu.        
                2022. "TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials" Electronics 11, no. 13: 2043.
        https://doi.org/10.3390/electronics11132043
    
    APA Style
    
                                Shao, J.,                                 Song, R.,                                 Chi, Y.,                                 Liang, B.,                                 & Wu, Z.        
        
        (2022). TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials. Electronics, 11(13), 2043.
        https://doi.org/10.3390/electronics11132043