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Journal: Electronics, 2021
Volume: 10
Number: 680
Article:
Identifying the Optimal Subsets of Test Items through Adaptive Test for Cost Reduction of ICs
Authors:
by
Huaguo Liang, Jinlei Wan, Tai Song and Wangchao Hou
Link:
https://www.mdpi.com/2079-9292/10/6/680
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