Zhang, X.; Zheng, Y.; Zhang, C.; Dong, Q.; Zhao, S.; Liu, J.; Wang, F.; Zhang, Y.; Xiong, F.
A Fading Tolerant Phase-Sensitive Optical Time Domain Reflectometry Based on Phasing-Locking Structure. Electronics 2021, 10, 535.
https://doi.org/10.3390/electronics10050535
AMA Style
Zhang X, Zheng Y, Zhang C, Dong Q, Zhao S, Liu J, Wang F, Zhang Y, Xiong F.
A Fading Tolerant Phase-Sensitive Optical Time Domain Reflectometry Based on Phasing-Locking Structure. Electronics. 2021; 10(5):535.
https://doi.org/10.3390/electronics10050535
Chicago/Turabian Style
Zhang, Xuping, Yunyin Zheng, Chi Zhang, Qiuhao Dong, Shisong Zhao, Jingxiao Liu, Feng Wang, Yixin Zhang, and Fei Xiong.
2021. "A Fading Tolerant Phase-Sensitive Optical Time Domain Reflectometry Based on Phasing-Locking Structure" Electronics 10, no. 5: 535.
https://doi.org/10.3390/electronics10050535
APA Style
Zhang, X., Zheng, Y., Zhang, C., Dong, Q., Zhao, S., Liu, J., Wang, F., Zhang, Y., & Xiong, F.
(2021). A Fading Tolerant Phase-Sensitive Optical Time Domain Reflectometry Based on Phasing-Locking Structure. Electronics, 10(5), 535.
https://doi.org/10.3390/electronics10050535