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Journal: Electronics, 2021
Volume: 10
Number: 455
Article:
Prediction Model for Random Variation in FinFET Induced by Line-Edge-Roughness (LER)
Authors:
by
Jinwoong Lee, Taeeon Park, Hongjoon Ahn, Jihwan Kwak, Taesup Moon and Changhwan Shin
Link:
https://www.mdpi.com/2079-9292/10/4/455
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