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Journal: Electronics, 2021
Volume: 10
Number: 455

Article: Prediction Model for Random Variation in FinFET Induced by Line-Edge-Roughness (LER)
Authors: by Jinwoong Lee, Taeeon Park, Hongjoon Ahn, Jihwan Kwak, Taesup Moon and Changhwan Shin
Link: https://www.mdpi.com/2079-9292/10/4/455

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