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Journal: Electronics, 2021
Volume: 10
Number: 3028

Article: Revisiting Symptom-Based Fault Tolerant Techniques against Soft Errors
Authors: by Hwisoo So, Moslem Didehban, Yohan Ko, Reiley Jeyapaul, Jongho Kim, Youngbin Kim, Kyoungwoo Lee and Aviral Shrivastava
Link: https://www.mdpi.com/2079-9292/10/23/3028

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