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Journal: Electronics, 2021
Volume: 10
Number: 2738
2738
Article: Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT
Authors: by Martin Florovič, Jaroslav Kováč, Jr., Aleš Chvála, Jaroslav Kováč, Jean-Claude Jacquet and Sylvain Laurent Delage
Link: https://www.mdpi.com/2079-9292/10/22/2738

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