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Journal: Electronics, 2021
Volume: 10
Number: 2144
Article:
Diagnosis of Faults Induced by Radiation and Circuit-Level Design Mitigation Techniques: Experience from VCO and High-Speed Driver CMOS ICs Case Studies
Authors:
by
Danilo Monda, Gabriele Ciarpi and Sergio Saponara
Link:
https://www.mdpi.com/2079-9292/10/17/2144
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