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Journal: Electronics, 2021
Volume: 10
Number: 1585
Article:
Simulation of FDSOI-ISFET with Tunable Sensitivity by Temperature and Dual-Gate Structure
Authors:
by
Hanbin Wang, Jinshun Bi, Mengxin Liu and Tingting Han
Link:
https://www.mdpi.com/2079-9292/10/13/1585
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