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Structure and Conductivity Studies of Scandia and Alumina Doped Zirconia Thin Films

1
Physics Department, Kaunas University of Technology, Studentu str. 50, LT-51368 Kaunas, Lithuania
2
Department of Thermal Physics and Technical Physics, Al-Farabi Kazakh National University, 71 Al-Farabi Ave., 050040 Almaty, Kazakhstan
*
Author to whom correspondence should be addressed.
Coatings 2019, 9(5), 317; https://doi.org/10.3390/coatings9050317
Received: 22 March 2019 / Revised: 2 May 2019 / Accepted: 8 May 2019 / Published: 12 May 2019
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Abstract

In this work, scandia-doped zirconia (ScSZ) and scandia–alumina co-doped zirconia (ScSZAl) thin films were prepared by electron beam vapor deposition. X-ray diffraction (XRD) results indicated a presence of ZrO2 cubic phase structure, yet Raman analysis revealed the existence of secondary tetragonal and rhombohedral phases. Thus, XRD measurements were supported by Raman spectroscopy in order to comprehensively analyze the structure of formed ScSZ and ScSZAl thin films. It was also found that Al dopant slows down the formation of the cubic phase. The impedance measurements affirmed the correlation of the amount of secondary phases with the conductivity results and nonlinear crystallite size dependence. View Full-Text
Keywords: scandium stabilized zirconia thin films; e-beam physical vapor deposition; thin films ceramics; Raman spectroscopy; X-ray diffraction scandium stabilized zirconia thin films; e-beam physical vapor deposition; thin films ceramics; Raman spectroscopy; X-ray diffraction
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Sriubas, M.; Kainbayev, N.; Virbukas, D.; Bočkutė, K.; Rutkūnienė, Ž.; Laukaitis, G. Structure and Conductivity Studies of Scandia and Alumina Doped Zirconia Thin Films. Coatings 2019, 9, 317.

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